Comparison of Origins of Re-Entrant Supercurrents at High In-Plane Magnetic Fields in Planar InAs-Al Josephson Junctions

Experimental and numerical study of re-entrant switching currents in InAs/Al planar Josephson junctions under high in-plane magnetic fields.

Key Results

Observes re-entrant supercurrent features across several device geometries.
Shows that corrugation- and disorder-driven mode interference can reproduce re-entrance without a Zeeman-driven topological transition.
Establishes that re-entrant critical-current structure is not, by itself, a unique Majorana or topological diagnostic.